Fuzzy Models and Algorithms for Pattern Recognition and Image Processing

Bezdek, James C.; Keller, James; Krisnapuram, Raghu; Pal, Nikhil R.

ISBN 10: 0792385217 / ISBN 13: 9780792385219

Published by Kluwer Academic Publishers, 1999

About this Item

This study introduces the use of fuzzy models in pattern recognition and selected topics in image processing and computer vision. The main topics are clustering and classifier design, with extensive material on feature analysis relational clustering, image processing and computer vision. Series: The Handbooks of Fuzzy Sets. Num Pages: 776 pages, biography. BIC Classification: PBWX; UYQV. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 42. Weight in Grams: 1282. . 1999. Hardback. . . . . Books ship from the US and Ireland.

Seller Inventory # V9780792385219

Bibliographic Details

• Title: Fuzzy Models and Algorithms for Pattern Recognition and Image Processing
• Publisher: Kluwer Academic Publishers
• Publication Date: 1999
• Language: English
• ISBN 10: 0792385217
• ISBN 13: 9780792385219
• Binding: Hardcover
• Condition: New

About this title

Synopsis

Fuzzy Models and Algorithms for Pattern Recognition and Image Processing presents a comprehensive introduction of the use of fuzzy models in pattern recognition and selected topics in image processing and computer vision. Unique to this volume in the Kluwer Handbooks of Fuzzy Sets Series is the fact that this book was written in its entirety by its four authors. A single notation, presentation style, and purpose are used throughout. The result is an extensive unified treatment of many fuzzy models for pattern recognition. The main topics are clustering and classifier design, with extensive material on feature analysis relational clustering, image processing and computer vision. Also included are numerous figures, images and numerical examples that illustrate the use of various models involving applications in medicine, character and word recognition, remote sensing, military image analysis, and industrial engineering.