Graphical Introduction - Semiconductor Device Defect and Failure Analysis Technology Lecture Reliability Technology Series Editorial Committee(Chinese Edition)
Language: English
Published by Mechanical Industry Press, 2024
- Softcover
- New
Condition: New
US$ 132.75
Quantity: 1 available
Add to basketItem description from seller
Language:Chinese.Paperback. Pub Date: 2024-03 Pages: 168 Publisher: China Machinery Press This book is divided into 4 chapters. including an overview of semiconductor device defects and failure analysis technology. failure analysis technology of silicon integrated circuits (li). defects and failure analysis technology of power devices. and defects and failure analysis technology of compound semiconductor light-emitting devices. The author has opened columns in various places in the book to in.
Seller Inventory # DS054453
- Title
- Graphical Introduction - Semiconductor Device Defect and Failure Analysis Technology Lecture Reliability Technology Series Editorial Committee(Chinese Edition)
- Author
- KE KAO XING JI SHU CONG SHU JI WEI YUAN HUI ( RI )
- Publisher
- Mechanical Industry Press
- Publication year
- 2024
- Condition
- New
- Binding
- paperback
- Language
- English
- ISBN 10
- 7111749626
- ISBN 13
- 9787111749622
"Synopsis" may belong to another edition of this title.
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