Handbook of Microscopy: Applications in Materials Science, Solid-State Physics, and Chemistry / Methods II

ISBN 10: 3527294732 / ISBN 13: 9783527294732

Published by Wiley-VCH, 1996

About this Item

Ancien livre de bibliothèque avec équipements. Couverture différente. Edition 1996. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Different cover. Edition 1996. Ammareal gives back up to 15% of this item's net price to charity organizations.

Seller Inventory # H-624-795

Bibliographic Details

• Title: Handbook of Microscopy: Applications in Materials Science, Solid-State Physics, and Chemistry / Methods II
• Publisher: Wiley-VCH
• Publication Date: 1996
• Language: English
• ISBN 10: 3527294732
• ISBN 13: 9783527294732
• Binding: Softcover
• Condition: Bon

About this title

Synopsis

Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.

With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"

From the Back Cover

Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Electron Microscopy: Scanning Beam Methods, Magnetic Methods: NMR-Microscopy, Scanning Electron Microscopy with Polarization Analysis (SEMPA). Emission Methods: Photoemission Electron Microscopy, Field Emission Microscopy (FEM), Field Ion Microscopy. Scanning Point Probe Techniques: Scanning Tunnelling Microscopy STM, Atomic Force Microscopy AFM, Magnetic Force Microscopy MFM, Ballistic Electron Emission Microscopy (BEEM), Methods Under Development. Image Recording, Handling and Processing: Electronic Image Recording. Image Processing Special Topics: Coincidence Microscopy, Low Energy Holography.