Handbook of Optical Metrology : Principles and Applications, Second Edition

Toru Yoshizawa

ISBN 10: 1466573597 / ISBN 13: 9781466573598

Published by CRC Press Apr 2015, 2015

About this Item

Neuware - Designed to provide beginners with an introduction to optical metrology without sacrificing rigor, this handbook discusses key principles and techniques before exploring practical applications. It explores everything from interferometry, holography, and Moiré metrology to diffraction, scattering, and polarization. This second edition is fully revised to reflect the latest developments. It also includes four new chapters-nearly 100 pages-on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Seller Inventory # 9781466573598

Bibliographic Details

• Title: Handbook of Optical Metrology : Principles and Applications, Second Edition
• Publisher: CRC Press Apr 2015
• Publication Date: 2015
• Language: English
• ISBN 10: 1466573597
• ISBN 13: 9781466573598
• Binding: Buch
• Edition: 2nd Edition
• Condition: Neu
• Dimensions: 254W x 183H x 53D millimeters 254 millimeters width by 183 millimeters height by 53 millimeters depth
• Weight: 1837 grams

About this title

Synopsis

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text:

• Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements
• Addresses interferometry, holography, and speckle methods and applications
• Explains Moiré metrology and the optical heterodyne measurement method
• Delves into the specifics of diffraction, scattering, polarization, and near-field optics
• Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes

This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters―nearly 100 pages―on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

About the Author

Toru Yoshizawa received his BS, MS, and doctorate of engineering from the University of Tokyo, Japan. After ten years of research and educational works at Yamanashi University, Kofu, Japan, he moved to Tokyo University of Agriculture and Technology, Japan, where he was professor in the Department of Mechanical Systems Engineering for 25 years. After retirement from the university, he worked in industry for three years, and then moved to Saitama Medical University, Japan to explore medical and biomedical fields using optical techniques. Currently he is director at Non-Profit Organization 3D Associates, Yokohama, Japan, and professor emeritus at Tokyo University of Agriculture and Technology.