Hermeticity Testing of MEMS and Microelectronic Packages (Integrated Microsystems). This item is unavailable.
Language: English
Published by Artech House Publishers, 2013
- Hardcover
- Used
Unavailable
Hardcover
Condition: Used - Very good
US$ 69.99
Item description from seller
Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked.
Seller Inventory # VG-120E7-HC-1608075273-1P1-ORN B8
- Title
- Hermeticity Testing of MEMS and Microelectronic Packages (Integrated Microsystems)
- Author
- Costello, Suzanna; Desmulliez, Marc P Y
- Publisher
- Artech House Publishers
- Publication year
- 2013
- Condition
- Very Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 1608075273
- ISBN 13
- 9781608075270
- Item weight
- 1.2 pounds
- Series
- Book 2 of 3: Integrated Microsystems
Packaging of microelectronics has been developing since the invention of the transistor in 1947. The authors cover the history and development of packaging, along with a view to understanding initial hermeticity testing requirements and the subsequent limitations of these methods when applied to new package types.
"Synopsis" may belong to another edition of this title.
About the Author
Marc P.Y. Desmulliez is the head of the research institute in sensors, signals, and systems at Heriot-Watt University. He earned his Ph.D. in electrical engineering from Heriot-Watt University. Suzanne Costello is a development scientist at MCS Ltd. She earned her Ph.D. in engineering from Heriot-Watt University.
"About the title" may belong to another edition of this title.