Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science (89))

Bhattacharya, Debashis, Hayes, John P.

ISBN 10: 1461288193 ISBN 13: 9781461288190
Published by Springer, 2011
Language: English
Used Condition: Like New Soft cover

From Mispah books, Redhill, SURRE, United Kingdom

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