High Resolution Electron Microscopy of Defects in Materials: Symposium Held April 16-18, 1990, San Francisco, California, U.S.A. (Materials Research, 183)

Robert Sinclair , David J. Smith , Ulrich Dahmen

ISBN 10: 1558990720 ISBN 13: 9781558990722
Published by Materials Research Society, 1990
Language: English
Condition: Used - Good Hardcover

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