High-Resolution Electron Microscopy for Materials Science

Daisuke Shindo

ISBN 10: 4431702342 / ISBN 13: 9784431702344

Published by Springer, Springer, 1999

About this Item

Druck auf Anfrage Neuware - Printed after ordering - High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Seller Inventory # 9784431702344

Bibliographic Details

• Title: High-Resolution Electron Microscopy for Materials Science
• Publisher: Springer, Springer
• Publication Date: 1999
• Language: English
• ISBN 10: 4431702342
• ISBN 13: 9784431702344
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 280W x 210H x 12D millimeters 280 millimeters width by 210 millimeters height by 12 millimeters depth
• Weight: 513 grams

About this title

Synopsis

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Language Notes

Text: English (translation)
Original Language: Japanese