nach der Bestellung gedruckt Neuware - Printed after ordering - The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.

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Bibliographic Details

Title: High Resolution X-Ray Diffractometry And Topography
Publisher: CRC Press
Publication Date: 2019
Language: English
ISBN 10: 0367400634
ISBN 13: 9780367400637
Binding: Taschenbuch
Condition: Neu
Dimensions: 246 millimeters width by 174 millimeters height by 14 millimeters depth
Weight: 476 grams

About this title

Synopsis

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

About the Author

Bowen, D.K.; Tanner, Brian K.

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AHA-BUCH GmbH
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