Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean. ; 24.6 X 17.4 X 1.56 centimeters; 264 pages.

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Bibliographic Details

Title: High Resolution X-Ray Diffractometry and Topography
Publisher: CRC Press
Publication Date: 1998
Language: English
ISBN 10: 0850667585
ISBN 13: 9780850667585
Binding: Hardcover
Condition: Very Good
Weight: 1 pound

About this title

Synopsis

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

About the Author

Bowen, D.K.; Tanner, Brian K.

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Mahler Books
TX, U.S.A.

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