High Resolution X-Ray Diffractometry and Topography

Language: English

Published by CRC Press, 1998

0850667585 / 9780850667585

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Seller: Mahler Books, PFLUGERVILLE, TX, U.S.A.Mahler Books

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Hardcover

Condition: Used - Very good

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Item description from seller

Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean. ; 24.6 X 17.4 X 1.56 centimeters; 264 pages.

Seller Inventory # 06SA24-659-209

Title
High Resolution X-Ray Diffractometry and Topography
Author
Bowen, D. K. & Brian K. Tanner
Publisher
CRC Press
Publication year
1998
Condition
Very Good
Binding
Hardcover
Language
English
ISBN 10
0850667585
ISBN 13
9780850667585
Item weight
1 pound

Mahler Books

PFLUGERVILLE, TX, U.S.A.

5-star seller

AbeBooks seller since February 15, 2005

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Mahler Books

TX, U.S.A.