High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
Language: English
Published by Springer, 1998
- Hardcover
- Used
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- Title
- High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
- Author
- Holy, Vaclav, Pietsch, Ullrich, Baumbach, Tilo
- Publisher
- Springer
- Publication year
- 1998
- Condition
- Like New
- Book Type
- book
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 354062029X
- ISBN 13
- 9783540620297
- Series
- Book 59 of 227: Springer Tracts in Modern Physics
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
"Synopsis" may belong to another edition of this title.
From the Back Cover
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
"About the title" may belong to another edition of this title.
Mispah books
Redhill, Surrey, United Kingdom
AbeBooks seller since April 15, 2021
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