The IEEE International Workshop on Defect And Fault Tolerance in Vlsi Systems

International Workshop on Defect and Fault Tolerance in VLSI

ISBN 10: 0818663073 / ISBN 13: 9780818663079

Published by IEEE, 1994

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Bibliographic Details

• Title: The IEEE International Workshop on Defect And Fault Tolerance in Vlsi Systems
• Publisher: IEEE
• Publication Date: 1994
• Language: English
• ISBN 10: 0818663073
• ISBN 13: 9780818663079
• Binding: hardcover
• Condition: New
• Book Type: book

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Synopsis

Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright Book News, Inc. Portland, Or.