Image Processing for the Detection of Features and Defects

Language: English

Published by LAP LAMBERT Academic Publishing Feb 2023, 2023

6206144593 / 9786206144595

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -This book considers the algorithms of image clustering, approximation, flood-filling, thinning, segmentation, and image transformation. It shows how approximation helps to determine coordinates of segmentation levels that are a base to select the main objects of attention, and details how approximation and distributed cumulative histograms can be applied to face images to detect useful features in the recognition systems. This book will be useful for students, engineers, and scientists interested in computers and information technology, and for anyone interested in images and their role in information systems. 324 pp. Englisch.

Seller Inventory # 9786206144595

Title
Image Processing for the Detection of Features and Defects
Author
Roman Melnyk
Publisher
LAP LAMBERT Academic Publishing Feb 2023
Publication year
2023
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
6206144593
ISBN 13
9786206144595
Item weight
500 grams
Dimensions
220x150x20 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First itemUS$ 26.71US$ 26.71
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BuchWeltWeit Ludwig Meier e.K.

Germany