Infrared Spectroscopic Techniques to Characterize Thin Polymer Films

The objectives of this book are to apply variable angle infrared (IR) spectroscopy in internal and external reflection mode to thin polymer films relevant to organic electronic devices. The essential objectives of this work are: to obtain infrared spectra over a range of angles of incidence for poly (methyl methacrylate) films (otherwise known as PMMA) in internal (attenuated total) and external (Reflection absorption) reflection; to compare the sensitivity of each configuration to simple models; to quantify film thickness for known thin polymer film samples to establish the reliability of infrared spectroscopy for film thickness determination; to use the calibration data obtained to study some unknown polymer brush samples both qualitatively and quantitatively. Thin PMMA films are typically used as a gate insulating layer in the manufacture of organic field effect transistor (OFET) devices used in semiconductor applications.