Integrated Circuit Quality and Reliability
Language: English
Published by Taylor & Francis Group, 1994
- Hardcover
- New

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pp. 808 2nd Edition.
Seller Inventory # 262152843
- Title
- Integrated Circuit Quality and Reliability
- Author
- Eugene R. Hnatek
- Publisher
- Taylor & Francis Group
- Publication year
- 1994
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0824792831
- ISBN 13
- 9780824792831
- Edition
- 2nd Edition
- Series
- Book 1 of 55: Electrical and Computer Engineering
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
"Synopsis" may belong to another edition of this title.
About the Author
Hnatek, Eugene R.
"About the title" may belong to another edition of this title.
Books Puddle
Woodside, NY, U.S.A.
4-star seller
AbeBooks seller since November 22, 2018
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