Interconnect Reliability in Advanced Memory Device Packaging

Language: English

Published by Springer-Nature New York Inc, 2023

3031267079 / 9783031267079

Series: Book 86 of 90 - Springer Series in Reliability Engineering

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Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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228 pages. 9.25x6.10x0.63 inches. In Stock.

Seller Inventory # x-3031267079

Title
Interconnect Reliability in Advanced Memory Device Packaging
Author
Gan, Chong Leong/ Huang, Chen-yu
Publisher
Springer-Nature New York Inc
Publication year
2023
Condition
Brand New
Binding
Hardcover
Language
English
ISBN 10
3031267079
ISBN 13
9783031267079
Item weight
0.59 kilograms
Series
Book 86 of 90: Springer Series in Reliability Engineering

Revaluation Books

Exeter, United Kingdom

5-star seller

AbeBooks seller since January 6, 2003

Shipping rates from United Kingdom to U.S.A.

Item7 to 14 business days2 to 3 business days
First itemUS$ 16.55US$ 39.72
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Edward Bowditch Ltd

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