Interconnect Reliability in Advanced Memory Device Packaging (Hardcover)

Language: English

Published by Springer International Publishing AG, Cham, 2023

3031267079 / 9783031267079

Series: Book 86 of 90 - Springer Series in Reliability Engineering

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Hardcover. This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing.In the past 40 years, memory packaging processes have evolved enormously. This book discusses the reliability and technical challenges of first-level interconnect materials, packaging processes, advanced specialty reliability testing, and characterization of interconnects. It also examines the reliability of wire bonding, lead-free solder joints such as reliability testing and data analyses, design for reliability in hybrid packaging and HBM packaging, and failure analyses. The specialty of this book is that the materials covered are not only for second-level interconnects, but also for packaging assembly on first-level interconnects and for the semiconductor back-end on 2.5D and 3D memory interconnects.This book can be used as a text for college and graduate students who have the potential to become our future leaders, scientists, and engineers in the electronics and semiconductor industry. This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing.In the past 40 years, memory packaging processes have evolved enormously. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Seller Inventory # 9783031267079

Title
Interconnect Reliability in Advanced Memory Device Packaging (Hardcover)
Author
Chong Leong, Gan
Publisher
Springer International Publishing AG, Cham
Publication year
2023
Condition
new
Binding
Hardcover
Language
English
ISBN 10
3031267079
ISBN 13
9783031267079
Series
Book 86 of 90: Springer Series in Reliability Engineering

Grand Eagle Retail

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