Interconnection Network Reliability Evaluation: Multistage Layouts (Performability Engineering Series)

Goyal, Neeraj Kumar; Rajkumar, S.

ISBN 10: 1119620589 / ISBN 13: 9781119620587

Published by John Wiley & Sons, 2020

About this Item

Seller Inventory # 382438310

Bibliographic Details

• Title: Interconnection Network Reliability Evaluation: Multistage Layouts (Performability Engineering Series)
• Publisher: John Wiley & Sons
• Publication Date: 2020
• Language: English
• ISBN 10: 1119620589
• ISBN 13: 9781119620587
• Binding: Hardcover
• Condition: New

About this title

Synopsis

This book presents novel and efficient tools, techniques and approaches for reliability evaluation, reliability analysis, and design of reliable communication networks using graph theoretic concepts.

In recent years, human beings have become largely dependent on communication networks, such as computer communication networks, telecommunication networks, mobile switching networks etc., for their day-to-day activities. In today's world, humans and critical machines depend on these communication networks to work properly. Failure of these communication networks can result in situations where people may find themselves isolated, helpless and exposed to hazards. It is a fact that every component or system can fail and its failure probability increases with size and complexity.

The main objective of this book is to devize approaches for reliability modeling and evaluation of such complex networks. Such evaluation helps to understand which network can give us better reliability by their design. New designs of fault-tolerant interconnection network layouts are proposed, which are capable of providing high reliability through path redundancy and fault tolerance through reduction of common elements in paths. This book covers the reliability evaluation of various network topologies considering multiple reliability performance parameters (two terminal reliability, broadcast reliability, all terminal reliability, and multiple sources to multiple destinations reliability).

About the Author

Dr. Neeraj Kumar Goyal is currently an Associate Professor in Subir Chowdhury School of Quality and Reliability, Indian Institute of Technology (IIT), Kharagpur, India. He received his PhD degree from IIT Kharagpur in reliability engineering in 2006.His areas of research and teaching are network reliability, software reliability, electronic system reliability, reliability testing, probabilistic risk/safety assessment, and reliability design. He has completed various research and consultancy projects for various organizations, e.g. DRDO, NPCIL, Vodafone, and ECIL. He has contributed several research papers to various international journals and conference proceedings.

Dr. S. Rajkumar received his BE (Distinction) and ME (Distinction) degrees from Anna University, India, in 2009 and 2011, respectively. He obtained his PhD from the Indian Institute of Technology Kharagpur, India in 2017. Currently working as an Assistant Professor in Department of ECE at Adama Science and Technology University (ASTU), Ethiopia. His research interests include reliability engineering and interconnection networks. He has contributed notable research papers to international journals.