Interfaces In Materials Atomic Structure, Thermodynamics and Kinetics of SolidVapor, SolidLiquid and SolidSolid Interfaces

A thorough exploration of the atomic structures and properties ofthe essential engineering interfaces--an invaluable resourcefor students, teachers, and professionals

The most up-to-date, accessible guide to solid-vapor,solid-liquid, and solid-solid phase transformations, thisinnovative book contains the only unified treatment of these threecentral engineering interfaces. Employing a simple nearest-neighborbroken-bond model, Interfaces in Materials focuses on metal alloysin a straightforward approach that can be easily extended to alltypes of interfaces and materials. Enhanced with nearly 300illustrations, along with extensive references and suggestions forfurther reading, this book provides:
* A simple, cohesive approach to understanding the atomicstructure and properties of interfaces formed between solid,liquid, and vapor phases
* Self-contained discussions of each interface--allowingseparate study of each phase transformation
* A comparative look at the different interfaces, includingatomic structure and crystallography; anisotropy, roughening, andmelting; interfacial stability and segregation; continuous andledge growth models; and atomistic modeling
* An analysis of nearest-neighbor broken-bond results againstthermodynamic and kinetic descriptions of the interfaces
* Problem sets at the end of each chapter, emphasizing the keyconcepts detailed in the text

Spanning the fields of chemical, electrical and computerengineering, materials science, solid-state physics, andmicroscopy, Interfaces in Materials bridges a major gap in theliterature of surface and interface science.

JAMES M. HOWE, PhD, is Associate Professor of Materials Science and Engineering at the University of Virginia. He is the recipient of numerous honors and awards for his research on transformation interfaces and electron microscopy, and his articles have appeared in such journals as Philosophical Magazine A, Acta Metallurgica et Materialia, and Ultramicroscopy.