Interfacial Properties on the Submicrometer Scale (ACS Symposium Series, No. 781)

This book deals with the increasingly 'diminishing' interfaces that are resulting as device dimensions scale down. Chapter topics include nanomechanicals properties and structures of thin films in contrast to their bulk counterparts, from both experimental and theoretical perspectives; viscoelasticity, microroughness, and friction, particularly in polymers; advances in instrumentation such as scanning probes, x-ray scattering, sum frequency generation spectroscopy and nanorheometers; the origin of film properties via tailored molecular modification of film components; molecular dynamics simulations and modeling of interfaces.

Jane E. Frommer is at IBM Research Division, Almaden Research Center. Rene M. Overney is at University of Washington.