International Conference on IoT, Intelligent Computing and Security: Select Proceedings of IICS 2021 (Lecture Notes in Electrical Engineerin

This book comprises select peer-reviewed papers from the International Conference on IoT, Intelligent Computing and Security, IICS 2021. The contents focus on the latest research in artificial intelligence, IoT, intelligent computing, and leading technological convergence security challenges. The book also discusses AI-driven automation of highly connected smart devices across the globe presenting the fast technological shift with the futuristic scenario, bursting perspective of IoT, computational intelligence, and security concerns. This book supports the transfer of vital knowledge to the next generation of researchers, students, and practitioners in academia and industry.

Dr. Rajeev Agrawal has worked as Director and Professor at G.L. Bajaj Institute of Technology and Management, Greater Noida, India. He has an illustrated experience of more than 27 years in teaching and research and holds a B.E. degree in Electronics Engineering and M.Tech. degree in System Engineering. He received Ph.D. in the area of Wireless Communication Channels from the School of Computer and System Sciences, JNU, New Delhi. He was visiting professor at Kennesaw State University, Georgia, USA, under a joint research project in the area of Remote Patient Monitoring and Medical Imaging. His research areas include planning and performance analysis of wireless networks and medical image analysis for automated diagnosis, performance analysis of fog, and edge networks. He has more than 70 publications in international journals and proceedings. He has been awarded by various state and national agencies for his contribution to research and academics. He is also serving as a reviewerfor several reputed international journals and member of the editorial board for two international journals and an editor of a book by Elsevier in the area of Health Informatics and two lecture series by Springer.

Dr. Pabitra Mitra (Member, IEEE) received the B.Tech. degree in electrical engineering from IIT Kharagpur, Kharagpur, West Bengal, India, in 1996, and the Ph.D. degree from the Department of Computer Science and Engineering, Indian Statistical Institute, Kolkata, India, in 2005. Currently, he is working as a professor in the Department of Computer Science and Engineering, IIT Kharagpur. He has supervised eight Ph.D. students and 12 M.S. students (by research) on different issues related to AI and machine learning. His research interests are machine learning, data mining, pattern recognition, information retrieval, and image processing. As a part of publications, he has 40 journal articles, 7 chapters, 3 books, 100 conference proceedings, 3 reviews, and 2 editorials in his credit.

Dr. Arindam Pal is a senior research scientist at Data61 in Commonwealth Scientific and Industrial Research Organization (CSIRO). He is also a conjoint senior lecturer in the School of Computer Science and Engineering at UNSW Sydney. He has over 14 years of industrial research experience in companies like Microsoft, Yahoo!, Novell, CSIRO, Cognizant, and TCS Research. He has over 10 years of experience in Analytics and Machine Learning. He has published several papers at prestigious conferences such as ACM SIGIR, ACM CIKM, ACM JCDL, IEEE ICRA, and IEEE ICC. He has been granted 4 US patents and has filed 15 patents in various countries like the USA, European Union, and India. He has given more than 30 invited talks in Australia, India, USA, and Italy. He has managed and delivered high-quality software and impactful projects in Australia, the USA, and India. He has worked on evacuation planning, intelligent transportation, multirobot task allocation, phishing detection, data privacy, and security. He earned his Ph.D. in Computer Science and Engineering from IIT Delhi. He works on the business and research problems of CSIRO and collaborates with faculty members of universities, both in Australia and abroad. He publishes academic papers in conferences and journals. He is a senior member of both ACM and IEEE.