Introduction to Advanced System-on-Chip Test Design and Optimization

Erik Larsson

ISBN 10: 1441952691 / ISBN 13: 9781441952691

Published by Springer US, 2011

About this Item

Druck auf Anfrage Neuware - Printed after ordering - SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Seller Inventory # 9781441952691

Bibliographic Details

• Title: Introduction to Advanced System-on-Chip Test Design and Optimization
• Publisher: Springer US
• Publication Date: 2011
• Language: English
• ISBN 10: 1441952691
• ISBN 13: 9781441952691
• Binding: Taschenbuch
• Condition: Neu

About this title

Synopsis

SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. It first introduces readers to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. Then it discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The final part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process. Intended for graduate students and PhD-students working in the test field, the manual also aids researchers and professors who would like to get into the area of SOC testing.

About the Author

Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies