Paperback. This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field. Graduate level textbook covering the fundamentals of conventional transmission electron microscopy. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

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Bibliographic Details

Title: Introduction to Conventional Transmission Electron Microscopy (Paperback)
Publisher: Cambridge University Press, Cambridge
Publication Date: 2003
Language: English
ISBN 10: 0521629950
ISBN 13: 9780521629959
Binding: Paperback
Condition: new

About this title

Synopsis

This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. In addition to including a large selection of worked examples and homework problems, the volume is accompanied by a supplementary website (http://ctem.web.cmu.edu/) containing interactive modules and over 30,000 lines of free Fortran 90 source code. The work is based on a lecture course given by Marc De Graef in the Department of Materials Science and Engineering at Carnegie Mellon University.

About the Author

Professor of Materials Science and Engineering at Carnegie Mellon University.

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