An Introduction to Mixed-Signal IC Test and Measurement (The ^AOxford Series in Electrical and Computer Engineering)

Burns, Mark; Roberts, Gordon W.

ISBN 10: 0195140168 / ISBN 13: 9780195140163

Published by Oxford University Press, 2000

About this Item

This copy has clearly been enjoyedâ expect noticeable shelf wear and some minor creases to the cover. Binding is strong, and all pages are legible. May contain previous library markings or stamps.

Seller Inventory # DBV.0195140168.A

Bibliographic Details

• Title: An Introduction to Mixed-Signal IC Test and Measurement (The ^AOxford Series in Electrical and Computer Engineering)
• Publisher: Oxford University Press
• Publication Date: 2000
• Language: English
• ISBN 10: 0195140168
• ISBN 13: 9780195140163
• Binding: Hardcover
• Condition: acceptable

About this title

Synopsis

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.
An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.
This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial technology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly discussed, and the role of the test engineer is clearly defined.

About the Author

Mark Burns is at Texas Instruments. Gordon Roberts is at McGill University.