An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)

Burns, Mark/ Roberts, Gordon W.

ISBN 10: 0195140168 / ISBN 13: 9780195140163

Published by Oxford Univ Pr, 2001

About this Item

684 pages. 9.75x8.25x1.75 inches. In Stock.

Seller Inventory # 0195140168

Bibliographic Details

• Title: An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)
• Publisher: Oxford Univ Pr
• Publication Date: 2001
• Language: English
• ISBN 10: 0195140168
• ISBN 13: 9780195140163
• Binding: Hardcover
• Condition: Brand New
• Weight: 1.34 kilograms

About this title

Synopsis

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.
An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.
This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial technology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly discussed, and the role of the test engineer is clearly defined.

About the Author

Mark Burns is at Texas Instruments. Gordon Roberts is at McGill University.