Introduction to Scanning Transmission Electron Microscopy
Language: English
Published by Springer, 1998
- Softcover
- Used
Seller: Biblios, frankfurt am main, hessen, GermanyBiblios
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Softcover
Condition: Used
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Item description from seller
pp. 114.
Seller Inventory # 18457804
- Title
- Introduction to Scanning Transmission Electron Microscopy
- Author
- Keyse Robert J.
- Publisher
- Springer
- Publication year
- 1998
- Condition
- Used
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 0387915176
- ISBN 13
- 9780387915173
This useful resource provides a timely and comprehensive review of STE M, a subject of growing interest to many microscopists, and is ideal f or anyone seeking an introductory but complete explication of STEM. Th e authors' combined wealth of experience and the extensive examples pr ovided make it an excellent reference. Topics covered include: why STE M?, the instrument, the specimen, imaging with the STEM, diffraction w ith the STEM, analysis with STEM, chemical imaging, advanced STEM, and the limits of STEM.
"Synopsis" may belong to another edition of this title.
Biblios
frankfurt am main, hessen, Germany
4-star seller
AbeBooks seller since September 10, 2024
Shipping rates from Germany to U.S.A.
| Item | 25 to 45 business days | 8 to 14 business days |
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