This useful resource provides a timely and comprehensive review of STE M, a subject of growing interest to many microscopists, and is ideal f or anyone seeking an introductory but complete explication of STEM. Th e authors' combined wealth of experience and the extensive examples pr ovided make it an excellent reference. Topics covered include: why STE M?, the instrument, the specimen, imaging with the STEM, diffraction w ith the STEM, analysis with STEM, chemical imaging, advanced STEM, and the limits of STEM.

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