Introduction to Scanning Tunneling Microscopy (Hardcover)

C. Julian Chen

ISBN 10: 0195071506 / ISBN 13: 9780195071504

Published by Oxford University Press Inc, New York, 1993

About this Item

Hardcover. Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics. A guide to the use of STMs, written at the level of an advanced undergraduate physics student. The text can be read by nonspecialists working in related fields as well as students. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Seller Inventory # 9780195071504

Bibliographic Details

• Title: Introduction to Scanning Tunneling Microscopy (Hardcover)
• Publisher: Oxford University Press Inc, New York
• Publication Date: 1993
• Language: English
• ISBN 10: 0195071506
• ISBN 13: 9780195071504
• Binding: Hardcover
• Condition: new

About this title

Synopsis

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

About the Author

C. Julian Chen is at IBM Thomas J. Watson Research Center.