Ion Beam Analysis of Surfaces & Interfaces of Condensed Matter Systems

Chakraborty, Purushottam

ISBN 10: 1590335384 / ISBN 13: 9781590335383

Published by NOVA SCIENCE PUBLISHERS INC (11/2002), 2002

About this Item

LIVRE A L?ETAT DE NEUF. EXPEDIE SOUS 3 JOURS OUVRES. NUMERO DE SUIVI COMMUNIQUE AVANT ENVOI, EMBALLAGE RENFORCE. EAN:9781590335383.

Seller Inventory # SLIVCN-9781590335383

Bibliographic Details

• Title: Ion Beam Analysis of Surfaces & Interfaces of Condensed Matter Systems
• Publisher: NOVA SCIENCE PUBLISHERS INC (11/2002)
• Publication Date: 2002
• Language: English
• ISBN 10: 1590335384
• ISBN 13: 9781590335383
• Binding: Hardcover
• Condition: Used: Like New

About this title

Synopsis

The precision analysis of surfaces and interfaces of condensed matter systems is an area of significant importance in materials science and fascinates the scientific community. One of the reasons is that a well-characterized surface is an excellent system to test ideas about the physics of two-dimensional systems in both traditional solids like metals and semiconductors and in liquids, polymers and other organic materials. As technological advances have been made, a wide range of techniques characterizes surface systems of inherent complexities that are markedly different from those of bulk systems. Since each technique has its own characteristics with particular advantages over the other, complimentary analytical tools are generally used for surface characterizations that are at least adequate for the purpose of the user. With the rapid advancement in the techniques related to materials analysis, parallel developments in the ion beam methods have been made, generating a great deal of popularity for uses in analyzing surfaces and interfaces. In quantitative analyses, ion beams are accepted as a favored means owing to their extreme controllability. With the developments and diversification in ultra high vacuum and ion source instrumentation, complex ion optical designs have been realized simultaneously, eventually making ion beam methods a state-of-the-art means for probing surfaces and interfaces of condensed matter systems.