Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces

Sascha Sadewasser (u. a.)

ISBN 10: 3642271138 / ISBN 13: 9783642271137

Published by Springer, 2013

About this Item

Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces | Sascha Sadewasser (u. a.) | Taschenbuch | Springer Series in Surface Sciences | xiv | Englisch | 2013 | Springer | EAN 9783642271137 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Seller Inventory # 105538143

Bibliographic Details

• Title: Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces
• Publisher: Springer
• Publication Date: 2013
• Language: English
• ISBN 10: 3642271138
• ISBN 13: 9783642271137
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 19D millimeters 235 millimeters width by 155 millimeters height by 19 millimeters depth
• Weight: 528 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

From the Back Cover

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.