Kelvin Probe Force Microscopy

ISBN 10: 3642225659 / ISBN 13: 9783642225659

Published by Springer, 2011

About this Item

pp. 348.

Seller Inventory # 2648022062

Bibliographic Details

• Title: Kelvin Probe Force Microscopy
• Publisher: Springer
• Publication Date: 2011
• Language: English
• ISBN 10: 3642225659
• ISBN 13: 9783642225659
• Binding: Hardcover
• Condition: New

About this title

Synopsis

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

From the Back Cover

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.