Key Technologies for Semiconductor Metrology from a Patent Perspective(Chinese Edition)

Language: English

Published by Intellectual Property Publishing House, 2024

7513094969 / 9787513094962

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  • New
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Language:Chinese.Paperback. Pub Date: 2024-09 Pages: 218 Publisher: Intellectual Property Publishing House This book innovatively conducts a dual-line linkage and dual-dimensional positioning analysis. focusing on the patent layout of key core technologies in the semiconductor industry and the layout of key applicants. The research content closely follows the current urgent needs of the industry and future development trends. providing strong support for existing scientific research and effec.

Seller Inventory # DT023227

Title
Key Technologies for Semiconductor Metrology from a Patent Perspective(Chinese Edition)
Author
ZHI SHI CHAN QUAN JU ZHUAN LI JU ZHUAN LI SHEN CHA XIE ZUO JIANG SU ZHONG XIN
Publisher
Intellectual Property Publishing House
Publication year
2024
Condition
New
Binding
paperback
Language
English
ISBN 10
7513094969
ISBN 13
9787513094962

liu xing

Nanjing, JS, China

5-star seller

AbeBooks seller since April 7, 2009

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