LabVIEW Run Four Point Probe Device

John Agumba

ISBN 10: 3659134821 / ISBN 13: 9783659134821

Published by LAP LAMBERT Academic Publishing Jul 2012, 2012

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -This book is a product of a fascinating research done through an attempt to find a fast and an accurate means of performing I-V measurements across a semiconducting thin film sample by use of a four point probe system that adopts a Van der Pauw symmetry. From the book, the reader will gain vast knowledge in Thin film Physics, elecronic design, computer interfacing computer automation and measurements in LabVIEW platform. The book outlines step-by-step design and fabrication procedures of the probe head and the Van der Pauw switching device. The interfacing of the Keithley SourceMeter 2400 to a LabVIEW running computer via the serial port is also explained in details. The interfacing of the Van der Pauw circuit to the Computer via the parallel port for switching of the probe tips on the sample surface is also addressed. The book further explains the deposition of Cuprous Oxide thin films on a glass substrate by sputtering technique and explores how the deposition parameters affects the I-V characteristics of these thin films. The reader is encouraged to have a keen look at each design step and carefully follow through the block diagram codes for better understanding.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 140 pp. Englisch.

Seller Inventory # 9783659134821

Bibliographic Details

• Title: LabVIEW Run Four Point Probe Device
• Publisher: LAP LAMBERT Academic Publishing Jul 2012
• Publication Date: 2012
• Language: English
• ISBN 10: 3659134821
• ISBN 13: 9783659134821
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 9D millimeters 220 millimeters width by 150 millimeters height by 9 millimeters depth
• Weight: 227 grams

About this title

Synopsis

This book is a product of a fascinating research done through an attempt to find a fast and an accurate means of performing I-V measurements across a semiconducting thin film sample by use of a four point probe system that adopts a Van der Pauw symmetry. From the book, the reader will gain vast knowledge in Thin film Physics, elecronic design, computer interfacing computer automation and measurements in LabVIEW platform. The book outlines step-by-step design and fabrication procedures of the probe head and the Van der Pauw switching device. The interfacing of the Keithley SourceMeter 2400 to a LabVIEW running computer via the serial port is also explained in details. The interfacing of the Van der Pauw circuit to the Computer via the parallel port for switching of the probe tips on the sample surface is also addressed. The book further explains the deposition of Cuprous Oxide thin films on a glass substrate by sputtering technique and explores how the deposition parameters affects the I-V characteristics of these thin films. The reader is encouraged to have a keen look at each design step and carefully follow through the block diagram codes for better understanding.

About the Author

Agumba is a lecturer of Physics at Pwani University. He holds a M.Sc. degree in Physics and he is now pursuing a PhD in Physics at Universität Freiburg, Germany. Karimi holds a PhD in Physics and is a senior lecturer at Kenyatta University. Prof. Okumu is an associate Professor and the current Deputy Vice Chancellor-Academic at Kenyatta University.