Line ? Tester analysis for yield and yield contributing traits
Language: English
Published by LAP LAMBERT Academic Publishing, 2025
- Softcover
- New

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- Title
- Line ? Tester analysis for yield and yield contributing traits
- Author
- Rathod, Sanjay; Doke, Rushikesh
- Publisher
- LAP LAMBERT Academic Publishing
- Publication year
- 2025
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 3659889032
- ISBN 13
- 9783659889035
The highest value of mid parent, better parent and standard heterosis over two checks AKT-101 and JLT-408 were 64.99, 46.94, 41.93 and 39.55%, respectively for cross TBS-09 x V-21 followed by TBS-12 x V-34 (58.89, 42.64, 41.02 and 38.65%), TBS-05 x V-34 (53.87, 41.08, 33.06 and 30.83%), TBS-12 x V-21 (51.27, 32.85, 26.02 and 24.09%) and TBS-05 x V-21 (46.45, 31.80, 24.32 and 23.23%) expressed significant positive heterosis over mid parent, better parent and standard checks AKT-101 and JLT-408, respectively for seed yield per plant. These highly heterotic crosses also occupied top ranks in per se performance for seed yield per plant. Hence, these crosses would be exploited for isolating transgressive segregants for seed yield and its component traits for genetic improvement in sesame.
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Biblios
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