Long-Term Reliability of Nanometer VLSI Systems

Language: English

Published by Springer International Publishing, 2020

3030261743 / 9783030261740

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying .

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Title
Long-Term Reliability of Nanometer VLSI Systems
Author
Sheldon Tan|Mehdi Tahoori|Taeyoung Kim|Shengcheng Wang|Zeyu Sun|Saman Kiamehr
Publisher
Springer International Publishing
Publication year
2020
Condition
New
Binding
Soft cover
Language
English
ISBN 10
3030261743
ISBN 13
9783030261740
Seller catalogs
Mathematik/Naturwissenschaften/Technik/Medizin

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

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Item26 to 60 business days26 to 60 business days
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