Low Voltage Electron Microscopy: Principles and Applications (RMS - Royal Microscopical Society)

. Ed(s): Bell, David C.; Erdman, Natasha

ISBN 10: 111997111X / ISBN 13: 9781119971115

Published by Wiley, 2013

About this Item

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. Editor(s): Bell, David C.; Erdman, Natasha. Series: Royal Microscopical Society. Num Pages: 218 pages, Illustrations. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 236 x 151 x 16. Weight in Grams: 526. . 2013. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.

Seller Inventory # V9781119971115

Bibliographic Details

• Title: Low Voltage Electron Microscopy: Principles and Applications (RMS - Royal Microscopical Society)
• Publisher: Wiley
• Publication Date: 2013
• Language: English
• ISBN 10: 111997111X
• ISBN 13: 9781119971115
• Binding: Hardcover
• Condition: New

About this title

Synopsis

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.

It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.

About the Author

David C. Bell received his PhD in physics from the University of Melbourne, Australia in 1997 and completed his postdoctoral studies at MIT in 1999. He was research faculty and principal investigator at the University of Minnesota from 2000 to 2002. In 2003, he joined the Center for Nanoscale Systems at Harvard University as a principal scientist and became the Manager for Imaging and Analysis in 2007. He has been a lecturer in applied physics at Harvard since 2003 and is a teaching professor at the Harvard Extension School. In 2007, he was a visiting scientist at the Department of Materials, Oxford University, UK. Dr Bell is one of the renowned experts in the field of elemental analysis using electron microscopy (TEM and STEM) and has co-authored a book on this subject. He has authored more than 70 research papers on the subjects of microscopy, materials science and biology and holds several patents. He is an elected Fellow of the Royal Microscopical Society, UK.

Natasha Erdman received her Ph.D. in Materials Science and Engineering from Northwestern University (Chicago, IL) in 2002. After completing her Ph.D. she worked as a Senior Research Chemist at UOP LLC (currently Honeywell) in Des Plaines, IL focusing on investigation of structure-properties relationship in various catalysts using electron microscopy techniques. In 2004 Dr. Erdman as joined JEOL USA Inc., and currently serves as an SEM and Ion-Beam Product Manager. She has authored over 30 peer-reviewed papers on the subjects of microscopy, materials science, chemistry and biology and is a renowned expert on ion-beam based sample preparation techniques for electron microscopy.