Machine Learning Support for Fault Diagnosis of System-on-Chip

Language: English

Published by Springer International Publishing, Springer International Publishing Mär 2023, 2023

3031196384 / 9783031196386

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques. 328 pp. Englisch.…

Seller Inventory # 9783031196386

Title
Machine Learning Support for Fault Diagnosis of System-on-Chip
Author
Patrick Girard
Publisher
Springer International Publishing, Springer International Publishing Mär 2023
Publication year
2023
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3031196384
ISBN 13
9783031196386
Item weight
658 grams
Dimensions
241x160x24 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany