Machine Learning Support for Fault Diagnosis of System-on-Chip

Language: English

Published by Springer, Springer Mär 2024, 2024

3031196414 / 9783031196416

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This item is printed on demand - Print on Demand Titel. Neuware -This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 328 pp. Englisch.…

Seller Inventory # 9783031196416

Title
Machine Learning Support for Fault Diagnosis of System-on-Chip
Author
Patrick Girard
Publisher
Springer, Springer Mär 2024
Publication year
2024
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3031196414
ISBN 13
9783031196416
Item weight
499 grams
Dimensions
235x155x18 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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AbeBooks seller since January 23, 2017

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Impressum Thorsten Retsch Buchversand Mimpf2000 Oberölschnitz 16 95517 Emtmannsberg Deutschland Telefon: 09209-2023188 Email: mimpf2000@online.de USt-ID-Nr.: DE 235096871 Wir führen gebrauchte Bücher aus allen Sparten der Literatur

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