Materials Characterization: Introduction to Microscopic and Spectroscopic Methods - Second Edition

Yang Leng

ISBN 10: 3527334637 / ISBN 13: 9783527334636

Published by Blackwell Verlag GmbH, 2013

About this Item

Spuren von Feuchtigkeit / Nasse; Leichte Kratzer / Abnutzungen / Druckstellen. Now in its second edition, this textbook remains ideal for introductory courses on materials characterization, drawing from the author's extensive teaching experience with advanced undergraduate and postgraduate students. The new edition retains its effective didactical approach, featuring chapter introductions, exercise questions, and an online solution manual. All sections have been thoroughly revised, updated, and expanded, introducing two major new topics: electron backscattering diffraction and environmental scanning electron microscopy, along with fifty additional questions--approximately 20% new content overall. The first part focuses on methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, and scanning probe microscopy. The second part addresses chemical analysis techniques, introducing X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy, and popular surface analysis techniques like photoelectron and secondary ion mass spectroscopy. This section concludes with vibrational spectroscopies (infra-red and Raman) and important thermal analysis. The theoretical concepts are presented with minimal mathematics and physics, while technical aspects are aligned with actual measurement practices, ensuring the text remains accessible to its intended audience.

Seller Inventory # 820a7819-fc55-4ecb-94ba-6f7a10b5096b

Bibliographic Details

• Title: Materials Characterization: Introduction to Microscopic and Spectroscopic Methods - Second Edition
• Publisher: Blackwell Verlag GmbH
• Publication Date: 2013
• Language: English
• ISBN 10: 3527334637
• ISBN 13: 9783527334636
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: Fair

About this title

Synopsis

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.

The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.

The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.

The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

About the Author

Yang Leng is Professor, specialized in materials science and engineering, at The Hong Kong University of Science and Technology (HKUST). His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has extensively published in international journals. In addition, he has actively engaged in industrial consultancy. His contribution to teaching materials science and engineering is exemplified by the Teaching Excellence Appreciation award from the HKUST.