Materials Reliability in Microelectronics III: Volume 309

Edited by Kenneth P. Rodbell , William F. Filter , Harold J. Frost , Paul S. Ho

ISBN 10: 1107409489 ISBN 13: 9781107409484

Published by Cambridge University Press, 2014

Language: English

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1st edition. 514 pages. 9.02x5.98x1.02 inches. In Stock. This item is printed on demand.

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Bibliographic Details

Title: Materials Reliability in Microelectronics III: Volume 309
Publisher: Cambridge University Press
Publication Date: 2014
Language: English
ISBN 10: 1107409489
ISBN 13: 9781107409484
Binding: Paperback
Condition: Brand New
Weight: 0.68 kilograms

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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