Materials Science and Technology - Volume 2B: Characterization of Materials Part II :

This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics.

From the Contents:
DiNardo: Scanning Tunneling Microscopy. De Batist:
Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small-Angle Scattering of X-Rays and Neutrons

Materials Science and Technology A Comprehensive Treatment Edited by R.W Cahn, P. Haasen, E.J. Kramer The 18 volume series "Materials Science and Technology" is the first in-depth, topic-oriented reference work devoted to this growing interdisciplinary field. A compendium of current, state-of-the-art information, it covers the most important classes of materials: metals, ceramics, glasses, polymers, semiconductors, and composites. Each volume deals with properties, processing, applications, or general phenomena associated with these materials. Edited by internationally renowned figures in materials science, this series is sure to establish itself as a seminal work. Volume 2B: This is the second part of a two-part volume focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. Topics include: STM • mechanical spectroscopy • scanning Auger microscopy • acoustic microscopy • microstructure analysis • electron microprobe analysis • high energy ion beam analysis • field ion microscopy • neutron diffraction • small-angle scattering of X-rays and neutrons • characterizing polymer surfaces, interfaces, and thin films