Materials Science and Technology - Volume 2B: Characterization of Materials Part II :

Lifshin, E.:

ISBN 10: 3527282653 / ISBN 13: 9783527282654

Published by Weinheim, VCH, 1994

About this Item

775, [18] Seiten : mit Abbildungen : Ausgesondertes Bibliotheksexemplar mit den zugehörigen Kennzeichnungen, Bibliotheksaufkleber auf Buchrücken, Stempel auf Titelseite, Aufkleber, Stempel und RFID-Chip im Nachsatz, ansonsten in sehr gutem Zustand und nur sehr minimal lichtrandig B05-02-01Z Sprache: Englisch Gewicht in Gramm: 1538.

Seller Inventory # 1887108

Bibliographic Details

• Title: Materials Science and Technology - Volume 2B: Characterization of Materials Part II :
• Publisher: Weinheim, VCH
• Publication Date: 1994
• Language: English
• ISBN 10: 3527282653
• ISBN 13: 9783527282654
• Binding: Gr.-8°, gebundene Ausgabe
• Condition: Sehr gut
• Weight: 1538 grams
• Seller catalogs:
  • Technik

About this title

Synopsis

This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics.

From the Contents:
DiNardo: Scanning Tunneling Microscopy. De Batist:
Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small-Angle Scattering of X-Rays and Neutrons

From the Back Cover

Materials Science and Technology A Comprehensive Treatment Edited by R.W Cahn, P. Haasen, E.J. Kramer The 18 volume series "Materials Science and Technology" is the first in-depth, topic-oriented reference work devoted to this growing interdisciplinary field. A compendium of current, state-of-the-art information, it covers the most important classes of materials: metals, ceramics, glasses, polymers, semiconductors, and composites. Each volume deals with properties, processing, applications, or general phenomena associated with these materials. Edited by internationally renowned figures in materials science, this series is sure to establish itself as a seminal work. Volume 2B: This is the second part of a two-part volume focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. Topics include: STM • mechanical spectroscopy • scanning Auger microscopy • acoustic microscopy • microstructure analysis • electron microprobe analysis • high energy ion beam analysis • field ion microscopy • neutron diffraction • small-angle scattering of X-rays and neutrons • characterizing polymer surfaces, interfaces, and thin films