Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics

Oehrlein, G. S. (EDT); Maex, K. (EDT); Joo, Y. C. (EDT); Ogawa, S. (EDT); Wetzel, J. T. (EDT)

ISBN 10: 110741315X ISBN 13: 9781107413153
Published by Cambridge University Press, 2014
Language: English
Condition: New Soft cover

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