Maximum Entropy and Bayesian Methods

Ali Mohammad-Djafari (u. a.)

ISBN 10: 9048142725 / ISBN 13: 9789048142729

Published by Springer, 2010

About this Item

Maximum Entropy and Bayesian Methods | Ali Mohammad-Djafari (u. a.) | Taschenbuch | vi | Englisch | 2010 | Springer | EAN 9789048142729 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.

Seller Inventory # 107246877

Bibliographic Details

• Title: Maximum Entropy and Bayesian Methods
• Publisher: Springer
• Publication Date: 2010
• Language: English
• ISBN 10: 9048142725
• ISBN 13: 9789048142729
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 25D millimeters 235 millimeters width by 155 millimeters height by 25 millimeters depth
• Weight: 686 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

The Twelfth International Workshop on Maximum Entropy and Bayesian Methods in Sciences and Engineering (MaxEnt 92) was held in Paris, France, at the Centre National de la Recherche Scientifique (CNRS), July 19-24, 1992. It is important to note that, since its creation in 1980 by some of the researchers of the physics department at the Wyoming University in Laramie, this was the second time that it took place in Europe, the first time was in 1988 in Cambridge. The two specificities of MaxEnt workshops are their spontaneous and informal charac­ ters which give the participants the possibility to discuss easily and to make very fruitful scientific and friendship relations among each others. This year's organizers had fixed two main objectives: i) to have more participants from the European countries, and ii) to give special interest to maximum entropy and Bayesian methods in signal and image processing. We are happy to see that we achieved these objectives: i) we had about 100 participants with more than 50 per cent from the European coun­ tries, ii) we received many papers in the signal and image processing subjects and we could dedicate a full day of the workshop to the image modelling, restoration and recon­ struction problems.