Mechanical Characterization of One-Dimensional Nanomaterials: Using MEMS technology and in-situ SEM/TEM experimentations
Language: English
Published by VDM Verlag Dr. Müller, 2009
- Softcover
- New

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- Title
- Mechanical Characterization of One-Dimensional Nanomaterials: Using MEMS technology and in-situ SEM/TEM experimentations
- Author
- Peng, Bei
- Publisher
- VDM Verlag Dr. Müller
- Publication year
- 2009
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 3639095944
- ISBN 13
- 9783639095944
Novel materials and nanostructures with superior electro-mechanical properties are emerging in the development of novel devices. Engineering application of these materials requires accurate electro-mechanical characterization, which in turn requires development of novel experimental techniques. This book outlines the investigation of the mechanical and electrical properties of one- dimensional nanomaterials. One-dimensional nanomaterials such as carbon nanotubes (CNTs), ZnO and GaN nanowires were investigated using MEMS technology and in situ SEM/TEM experimentation. This nanoscale materials testing system (nMTS) allows the direct correlation of stress-strain state and defect nucleation and propagation. For CNTs, the fracture strengths of arc-discharge- grown multi-walled carbon nanotubes (MWCNTs) were measured using nMTs within a TEM. Single-shell failures were observed with a mean fracture strength in excess of 100 GPa, which exceeds prior observations by more than a factor of three. Using the same experiment, the Young¿s modulus and tensile strengths of ZnO and GaN NWs were measured.
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About the Author
Bei Peng received the Bachelor's degree from the Beijing University of Aeronautics and Astronautics, China, in 1999, the M.S. and Ph.D. degrees from Northwestern University, USA, in 2003 and 2008, repectively. He is currently an associate professor in the University of Electronic Science and Technology of China.
"About the title" may belong to another edition of this title.
Books Puddle
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