Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Quarterly Report, January 1 to March 31, 1972 (National Bureau of Standards / NBS Technical Note 733).
Published by National Bureau of Standards., 1972
- Softcover
- Used
Seller: Eryops Books, Stephenville, TX, U.S.A.Eryops Books
5-star seller
AbeBooks seller since July 11, 2003
Softcover
Condition: Used - Very good
US$ 8.95
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Item description from seller
ORIGINAL 1972 PUBLICATION; Softcover; in very good condition.
Seller Inventory # 023194
Bibliographic details
- Title
- Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Quarterly Report, January 1 to March 31, 1972 (National Bureau of Standards / NBS Technical Note 733).
- Author
- Bullis, W. Murray (Editor).
- Publisher
- National Bureau of Standards.
- Publication year
- 1972
- Condition
- Very Good
- Book Type
- Book
- Binding
- Soft cover
- Seller catalogs
- Physical Sciences
Eryops Books
Stephenville, TX, U.S.A.
5-star seller
AbeBooks seller since July 11, 2003
Shipping rates within U.S.A.
| Item | 5 to 14 business days | 3 to 6 business days |
|---|---|---|
| First item | US$ 6.00 | US$ 10.00 |
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Internet and Mail Order bookstore for out of print and rare books in the natural sciences, history and archeology.
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Paleontology, Archeology, Geology, Zoology, Botany, Natural HistorySeller's business information
Eryops Books
TX, U.S.A.
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