Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Quarterly Report, January 1 to March 31, 1972 (National Bureau of Standards / NBS Technical Note 733).

Published by National Bureau of Standards., 1972

  • Softcover
  • Used
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Seller: Eryops Books, Stephenville, TX, U.S.A.Eryops Books

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Softcover

Condition: Used - Very good

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Item description from seller

ORIGINAL 1972 PUBLICATION; Softcover; in very good condition.

Seller Inventory # 023194

Bibliographic details

Title
Methods of Measurement for Semiconductor Materials, Process Control, and Devices. Quarterly Report, January 1 to March 31, 1972 (National Bureau of Standards / NBS Technical Note 733).
Author
Bullis, W. Murray (Editor).
Publisher
National Bureau of Standards.
Publication year
1972
Condition
Very Good
Book Type
Book
Binding
Soft cover
Seller catalogs
Physical Sciences

Eryops Books

Stephenville, TX, U.S.A.

5-star seller

AbeBooks seller since July 11, 2003

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Internet and Mail Order bookstore for out of print and rare books in the natural sciences, history and archeology.

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Paleontology, Archeology, Geology, Zoology, Botany, Natural History

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Eryops Books

TX, U.S.A.