Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 31, 1973 (Classic Reprint)

W. Murray Bullis

ISBN 10: 0266830900 / ISBN 13: 9780266830900

Published by Forgotten Books, 2018

About this Item

Seller Inventory # 26380807112

Bibliographic Details

• Title: Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 31, 1973 (Classic Reprint)
• Publisher: Forgotten Books
• Publication Date: 2018
• Language: English
• ISBN 10: 0266830900
• ISBN 13: 9780266830900
• Binding: Hardcover
• Condition: New

About this title

Synopsis

Methods of Measurement for Semiconductor Materials, Process Control, and Devices offers a detailed view of techniques and tools in semiconductor research.

This quarterly report surveys ongoing work in resistivity measurement, carrier dynamics in silicon, infrared response, and advanced probing methods. It also covers the evaluation of wire bonds, die attachment, and the performance of microwave detector diodes, with supplementary data and appendices for staff and standards work.

• Learn how researchers study generation and recombination centers, gold-doped silicon, and thermal properties of semiconductor devices.
• See how various probing techniques and S-parameters are used to characterize device behavior.
• Explore methods for evaluating wire bonds, die attachment, and related microelectronic interfaces.
• Review experimental setups and data interpretation for ultrasonic bonding tools and their modal patterns.

Ideal for readers of technical reports in microelectronics, semiconductor processing, and device characterization.