Microelectronic Failure Analysis : Desk Reference

Thomas W.;Pabbisetty Seshu V. Lee

ISBN 10: 087170479X ISBN 13: 9780871704795

Published by Materials Park, Ohio, U.S.A.: Asm Intl January 1993, 1993

Language: English

Condition: Used - As new Hardcover

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Bibliographic Details

Title

Microelectronic Failure Analysis : Desk Reference

Publisher

Materials Park, Ohio, U.S.A.: Asm Intl January 1993

Publication Date

1993

Language

English

ISBN 10

087170479X

ISBN 13

9780871704795

Binding

Hardcover

Condition

Like New

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Back Room

About this title

Reviews

A compact compendium of information and techniques designed to address many of the varied subjects of concern to failure analysis. The volume is divided into sections devoted to failure analysis procedures and overview, electrical and mechanical characterization, specimen preparation, metallurgical and specimen decoration techniques, failure site localization techniques, analytical instrumentation, failure modes and mechanisms, and failure analysis reporting. The appendices contain the ISTFA 1976-1993 subject index, and resources for failure analysis. Annotation copyright Book News, Inc. Portland, Or.

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