Microelectronic Test Pattern NBS-3 for Evaluating the Resistivity - Dopant Density Relationship of Silicon. ( Seimiconductor Measurement Technology ).

Publisher

NBS Special Publication 400-22, 1976, 49 Pp.

Publication Date

1976

Binding

Soft Cover

Condition

Very Good

Seller catalogs

Physical Sciences

Store Description

Internet and Mail Order bookstore for out of print and rare books in the natural sciences, history and archeology.

Visit Seller's Storefront

Seller's business information

Eryops Books
TX, U.S.A.

Sale & Shipping Terms

Terms of Sale

U. S. Funds only. For credit card customers, please use the ABE site. Payment may also be made by check in US dollars on a U. S. bank, by Money Order or International Money Order, or via PayPal.

Shipping Terms

Shipping costs are based on books weighing 2.2 LB, or 1 KG. If your book order is heavy or oversized, we may contact you to let you know extra shipping is required.

Shipping rates within U.S.A.

Shipping rates within U.S.A.
Order quantity	5 to 14 business days	3 to 6 business days
First item	US$ 6.00	US$ 10.00

Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment Methods

Check Money Order

Add to Wants