Microelectronic Test Structures for CMOS Technology

Manjul Bhushan

ISBN 10: 1489990550 / ISBN 13: 9781489990556

Published by Springer, 2014

About this Item

: Este libro explora las estructuras de prueba microelectrónicas para la tecnología CMOS. Publicado por Springer, cuenta con 407 páginas y está disponible en formato de tapa blanda. El autor principal es Manjul Bhushan. EAN: 9781489990556 Tipo: Libros Categoría: Tecnología Título: Microelectronic Test Structures for CMOS Technology Autor: Manjul Bhushan Páginas: 407 Formato: tapa blanda.

Seller Inventory # Happ-2026-07-02-45d63b59

Bibliographic Details

• Title: Microelectronic Test Structures for CMOS Technology
• Publisher: Springer
• Publication Date: 2014
• Language: Spanish
• ISBN 10: 1489990550
• ISBN 13: 9781489990556
• Binding: Soft cover
• Condition: Muy bueno

About this title

Synopsis

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.