Microelectronic Test Structures for CMOS Technology

Mark B. Ketchen

ISBN 10: 1441993762 / ISBN 13: 9781441993762

Published by Springer New York, Springer US, 2011

About this Item

Druck auf Anfrage Neuware - Printed after ordering - Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors' overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.

Seller Inventory # 9781441993762

Bibliographic Details

• Title: Microelectronic Test Structures for CMOS Technology
• Publisher: Springer New York, Springer US
• Publication Date: 2011
• Language: English
• ISBN 10: 1441993762
• ISBN 13: 9781441993762
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 28D millimeters 241 millimeters width by 160 millimeters height by 28 millimeters depth
• Weight: 776 grams

About this title

Synopsis

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements.  Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.