Microscopic Identification of Electronic Defects in Semiconductors (Materia Ls Research Society Symposia Proceedings, Volume 46)
Language: English
Published by Materials Research Society, 1985
- Hardcover
- Used
Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart
AbeBooks seller since April 18, 1998
Condition: Used - Good
US$ 32.12
Quantity: 1 available
Add to basketItem description from seller
Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and s helf wear to exterior; binding slightly cocked; scrape to side edge of fron t cover; note written on table of contents page, otherwise text is clean; f ormer owner's stamping inside rear board; contents in good condition.
Seller Inventory # 64117
Bibliographic details
- Title
- Microscopic Identification of Electronic Defects in Semiconductors (Materia Ls Research Society Symposia Proceedings, Volume 46)
- Author
- Johnson, Noble M., Stephen G. Bishop, And George D. Watkins, Editors
- Publisher
- Materials Research Society
- Publication year
- 1985
- Condition
- UsedGood
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0931837111
- ISBN 13
- 9780931837111
BookDepart
Shepherdstown, WV, U.S.A.
AbeBooks seller since April 18, 1998
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BookDepart
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